Title :
Latch-up in bipolar low-voltage current sources
Author :
van Lienden, A.G. ; Meijer, G.C.M. ; van Drecht, J.
Abstract :
Latchup prevention is one general design problem of bipolar circuits able to operate at supply voltages of 1 V or even less. A method to solve this problem, using simple means to force saturation of some chosen transistors, is discussed. This method is demonstrated for application in low-voltage current sources. Conditions for a latchup-free design for various types of circuits and load-current situations have been derived and tested.
Keywords :
Bipolar integrated circuits; Constant current sources; bipolar integrated circuits; constant current sources; Bipolar transistor circuits; Circuit testing; Current supplies; Electronic circuits; Integrated circuit testing; Low voltage; Noise reduction; Switching circuits; System testing;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1987.1052865
