DocumentCode
904343
Title
A means of reducing custom LSI interconnection requirements
Author
Calhoun, Donald F. ; McNamee, Lawrence P.
Volume
7
Issue
5
fYear
1972
Firstpage
395
Lastpage
404
Abstract
Large-scale integrated circuit interconnect approaches such as pad relocation and discretionary techniques have been developed for interconnecting very large numbers of circuits on monolithic integrated-circuit wafers. Although these approaches were perhaps premature in their original development, considerable interest is currently being shown in full wafer LSI. In order to avoid the defective circuits that naturally occur on such large circuit arrays, it has been necessary to customize each wafer´s interconnection mask to its unique yield pattern. The authors examine in detail a means of using each mask set for perhaps several unique wafers, thus providing important custom routing and mask generation cost savings. In the case of pad relocation, only a single mask then comprises the entire custom mask set for several wafer arrays.
Keywords
Economics; Large scale integration; Masks; economics; large scale integration; masks; Aircraft; Circuit testing; Cities and towns; Costs; Electron devices; Integrated circuit interconnections; Integrated circuit yield; Large scale integration; Logic circuits; Standardization;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1972.1052899
Filename
1052899
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