• DocumentCode
    904584
  • Title

    VLSI implementation for one-dimensional multilevel lifting-based wavelet transform

  • Author

    Chen, Pei-Yin

  • Author_Institution
    Dept. of Electron. Eng., Southern Taiwan Univ. of Technol., Tainan, Taiwan
  • Volume
    53
  • Issue
    4
  • fYear
    2004
  • fDate
    4/1/2004 12:00:00 AM
  • Firstpage
    386
  • Lastpage
    398
  • Abstract
    The lifting scheme has been developed as a flexible tool suitable for constructing biorthogonal wavelets recently. We present an efficient VLSI architecture for the implementation of 1D lifting discrete wavelet transform. The architecture folds the computations of all resolution levels into the same low-pass and high-pass units to achieve higher hardware utilization. Because of its modular, regular, and flexible structure, the design is scalable for different resolution levels. In addition, its area is independent of the length of the 1D input sequence and its latency is independent of the number of resolution levels. Since the architecture has a similar topology to a scan chain, we can modify it easily to become a testable scan-based design by adding very few hardware resources. For the computations of N-sample 1D k-level analysis (5, 3) lifting wavelet transform, the design takes N+1 clock cycles, and requires two multipliers, four adders, and (3 + 2.25 × 2k) registers. In the simulation, it works with a clock period of 10 ns and achieves a processing rate of about 100 × 106 samples/sec for k-level lifting wavelet transform.
  • Keywords
    VLSI; adders; computational complexity; discrete wavelet transforms; high-pass filters; low-pass filters; signal processing; topology; VLSI architecture; adder; biorthogonal wavelets; clock cycle; discrete wavelet transform; lifting scheme; multiplier; one-dimensional multilevel lifting-based wavelet transform; register; scan-based design; signal processing; simulation; topology; Clocks; Computer architecture; Delay; Discrete wavelet transforms; Flexible structures; Hardware; Testing; Topology; Very large scale integration; Wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2004.1268396
  • Filename
    1268396