DocumentCode :
904792
Title :
Collector capacitance versus collector current for a double-diffused transistor
Author :
Collins, T.W.
Volume :
57
Issue :
5
fYear :
1969
fDate :
5/1/1969 12:00:00 AM
Firstpage :
840
Lastpage :
841
Abstract :
Collector junction capacitance is computed for a diffused reverse-biased collector junction in the presence of a limited velocity electron current. Two cases are considered--constant collector background doping and a heavily doped subcollector background. The computation shows that the collector junction capacitance can either increase or decrease depending on the doping profile of the subcollector structure.
Keywords :
Capacitance; Charge carrier density; Content addressable storage; Current density; Diodes; Doping profiles; Electrons; RNA; Silicon; Space charge;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1969.7112
Filename :
1449042
Link To Document :
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