• DocumentCode
    904919
  • Title

    Comments on "A Quick Accurate Method to Measure the Dielectric Constant of Microwave Integrated-Circuit Substrates" [Letters]

  • Author

    Ladbrooke, P.H. ; Potok, M.H.N. ; England, E.H.

  • Volume
    21
  • Issue
    8
  • fYear
    1973
  • Firstpage
    570
  • Lastpage
    571
  • Keywords
    Apertures; Conformal mapping; Dielectric constant; Dielectric losses; Dielectric measurements; Dielectric substrates; Image segmentation; Microwave measurements; Microwave theory and techniques; Resonant frequency;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1973.1128069
  • Filename
    1128069
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=904919