• DocumentCode
    905356
  • Title

    Asynchronous interconnect for synchronous SoC design

  • Author

    Lines, Andrew

  • Volume
    24
  • Issue
    1
  • fYear
    2004
  • Firstpage
    32
  • Lastpage
    41
  • Abstract
    System-on-chip (SoC) designs integrate a variety of cores and I/O interfaces, which usually operate at different clock frequencies. Communication between unlocked clock domains requires careful synchronization, which inevitably introduces metastability and some uncertainty in timing. Thus, any chip with multiple clock domains is already globally asynchronous. We have devised a more elegant and efficient solution to the multiple-clock-domain problem. Instead of gluing synchronous domains directly to each other with clock-domain bridges, we use asynchronous-circuit design techniques to handle all clock-domain crossing as well as all cross-chip communication and routing. The phase-locked loop (PLL) and clock distribution can be entirely local to each synchronous core, easing timing closure and improving the reusability of cores across multiple designs. Our solution, Nexus, is a globally asynchronous, locally synchronous (GALS) interconnect that features a 16-port, 36-bit asynchronous crossbar. The crossbar connects through asynchronous channels to clock-domain converters for each synchronous module. To ensure that Nexus will work robustly in a commercial application, we developed and applied many verification and test strategies, including novel variations of noise analysis, timing analysis, and fault and delay testing.
  • Keywords
    asynchronous circuits; integrated circuit design; phase locked loops; synchronisation; system-on-chip; I/O interfaces; Nexas globally asynchronous locally synchronous interconnect; clock frequencies; clock-domain crossing; cross-chip communication; delay testing; fault testing; noise analysis; phase-locked loop; synchronous SoC design; system-on-chip design; timing analysis; Bridges; Clocks; Frequency synchronization; Metastasis; Phase locked loops; Routing; System-on-a-chip; Testing; Timing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2004.1268991
  • Filename
    1268991