DocumentCode
905579
Title
Broad-Band Microwave Measurements on GaAs "Traveling-Wave" Transistors
Author
Dean, Raymond H. ; Dreeben, Arthur B. ; Hughes, John J. ; Matarese, Ralph J. ; Napoli, Louis S.
Volume
21
Issue
12
fYear
1973
fDate
12/1/1973 12:00:00 AM
Firstpage
805
Lastpage
809
Abstract
Instantaneous gain, noise figure, reverse attenuation, and gain and phase control measurements in the frequency range 8-18 GHz have been performed on GaAs traveling-wave transistors. The broad-band high-gain nature of the device together with the requirement for several bias connections precluded the use of standard test fixtures, and resulted in a package design exhibiting less than 1-dB insertion loss over the band together with 75- to 90-dB internal isolation. Untuned X-band gain, noise figure, and reverse attenuation were 12 dB, 18 dB, and 32 dB, respectively, and the gain and phase could be electronically varied over a 35-dB and 360° range. When RF tuning was employed, the gain, on the average, improved by 10 dB.
Keywords
Attenuation measurement; Frequency measurement; Gain measurement; Gallium arsenide; Microwave devices; Microwave measurements; Microwave transistors; Noise figure; Performance gain; Phase control;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1973.1128135
Filename
1128135
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