DocumentCode :
906167
Title :
On the beta falloff in junction transistors
Author :
Calzolari, P.U. ; Graffi, S. ; Hauser, J.R.
Volume :
57
Issue :
7
fYear :
1969
fDate :
7/1/1969 12:00:00 AM
Firstpage :
1293
Lastpage :
1294
Abstract :
It is shown that the βαIc-2law, experimentally verified for junction transistors at large collector currents, may be predicted on the basis of a general two-dimensional theory, valid for any injection level, developed by the authors in a previous paper.
Keywords :
Current density; Differential equations; Impurities; Predictive models; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1969.7234
Filename :
1449164
Link To Document :
بازگشت