• DocumentCode
    906263
  • Title

    Ferromagnetic Resonance Study of Annealed NiFe/FeMn/CoFe Trilayers

  • Author

    Kim, Ki-Yeon ; Choi, Hyeok-Cheol ; Shim, Je-Ho ; Kim, Dong-Hyun ; You, Chun-Yeol ; Lee, Jeong-Soo

  • Author_Institution
    Neutron Sci. Div., Korea Atomic Energy Res. Inst., Daejeon
  • Volume
    45
  • Issue
    6
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    2766
  • Lastpage
    2769
  • Abstract
    The effect of a thermal treatment on the exchange field in 19-nm NiFe(bottom)/15-nm FeMn/19-nm CoFe(top) trilayers has been investigated by employing a vibrating sample magnetometer (VSM) and a ferromagnetic resonance (FMR) spectrometer. FMR spectra as a function of applied dc field reveal that there are two distinct resonance peaks corresponding to each ferromagnetic layer. It is found that exchange fields determined from the in-plane angular dependence of the resonance field are in accord with that determined through the magnetic hysteresis loops for the NiFe/FeMn interface rather than the CoFe/FeMn one. A FMR linewidth broadening as a function of the annealing temperatures is attributed to the interdiffusion between the two magnetic interfaces across a FeMn layer.
  • Keywords
    annealing; chemical interdiffusion; cobalt alloys; exchange interactions (electron); ferromagnetic materials; ferromagnetic resonance; iron alloys; magnetic hysteresis; magnetic multilayers; magnetometers; manganese alloys; nickel alloys; FMR linewidth broadening; FMR spectra; NiFe-FeMn-CoFe; VSM; angular dependence; annealed trilayers; annealing temperatures; applied dc field; exchange field; ferromagnetic layer; ferromagnetic resonance spectrometer; interdiffusion; magnetic hysteresis loops; magnetic interfaces; size 15 nm; size 19 nm; thermal treatment; vibrating sample magnetometer; Exchange bias; FM/AFM/FM trilayer; ferromagnetic resonance; linewidth broadening; resonance field; thermal stability;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2020552
  • Filename
    4957748