Title :
Surface Barrier Silicon Detectors with a Large Active Area
Author :
Kim, Y. ; Kim, C. ; Ohkawa, S. ; Husimi, K. ; Sakai, T. ; Ikeda, Y.
Author_Institution :
Dept. of Electronics Engr.,Korea Univ., Kodaira, Tokyo 187, Japan
Keywords :
Conductivity; Crystalline materials; Crystals; Energy resolution; Fabrication; Leak detection; Leakage current; Radiation detectors; Silicon; Surface treatment;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4336877
