DocumentCode

906400

Title

Solid state reliability

Author

Battin, John W.

Author_Institution

Motorola, Inc., Chicago, Ill.

Volume

15

Issue

1

fYear

1966

fDate

3/1/1966 12:00:00 AM

Firstpage

1

Lastpage

5

Keywords

Art; Degradation; Electron tubes; Impedance; Maintenance; Oscillators; Relays; Reliability engineering; Solid state circuits; Temperature;

fLanguage

English

Journal_Title

IEEE Transactions on Vehicular Communications

Publisher

ieee

ISSN

0096-2503

Type

jour

DOI

10.1109/TVC.1966.33017

Filename

1621827