Title :
Method of obstacle admittance measurement in below-cutoff waveguides
Author_Institution :
Standard Telecommunication Laboratories, Harlow, UK
Abstract :
This letter describes a slotted-line admittance measurement of thin obstacles in waveguides operated below the H10 cutoff frequency. Two measurements are required to yield a result. Experimental results for two different obstacles are given.
Keywords :
admittance measurement; waveguides;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19700033
