DocumentCode
906540
Title
Fast Readout of CCD Images
Author
Turko, Bojan T.
Author_Institution
Lawrence Berkeley Laboratory University of California Berkeley, California 94720 U.S.A.
Volume
32
Issue
1
fYear
1985
Firstpage
576
Lastpage
580
Abstract
A new fast serial readout system for CCD imaging devices is described. Clock frequency of up to 65 MHz and 1 ¿s line transfer time make possible frame rates of approximately 500/s. A baseline stabilized video amplifier and fast peak stretcher also make possible high resolution frame readout with excellent dynamic range. It uses a fast dump readout sequence which clears the analog registers prior to the image charge transfer from the photoelements. The charge of any preset pixel can be individually extracted, its peak stretched, and the noise distribution measured by a multichannel pulse-height analyzer. Photographs of test pattern readouts at high clock frequencies are shown and the effect of clock and frame readout rates and temperature on noise distribution have been measured.
Keywords
Charge coupled devices; Charge measurement; Charge transfer; Clocks; Current measurement; Dynamic range; Frequency; High-resolution imaging; Noise measurement; Pulse measurements;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1985.4336899
Filename
4336899
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