DocumentCode :
906551
Title :
Computation of Dielectric Properties from Short-Circuited Waveguide Measurements on High- or Low-Loss Materials (Computer Program Descriptions)
Author :
Nelson, S.O.
Volume :
22
Issue :
3
fYear :
1974
fDate :
3/1/1974 12:00:00 AM
Firstpage :
342
Lastpage :
343
Abstract :
Computation of the relative complex permittivity components εr´ and εr´´ loss tangent, and conductivity from measurements data on materials in coaxial, rectangular, or cylindrical waveguides.
Keywords :
Coaxial components; Conducting materials; Conductivity measurement; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Loss measurement; Permittivity measurement; Rectangular waveguides; Waveguide components;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1974.1128224
Filename :
1128224
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=906551
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