• DocumentCode
    906599
  • Title

    CuS thin films on flexible substrates

  • Author

    Pala, N. ; Rumyantsev, S.L. ; Sinius, J. ; Talapatra, S. ; Shur, M.S. ; Gaska, R.

  • Author_Institution
    Sensor Electron. Technol., Columbia, SC, USA
  • Volume
    40
  • Issue
    4
  • fYear
    2004
  • Firstpage
    273
  • Lastpage
    274
  • Abstract
    A report is presented on the electrical and structural properties of Cu7S4 films deposited on polyimide substrate at temperatures close to room temperature using the water solutions of complex-salt compounds. The X-ray diffraction data identified Cu7S4 crystalline monoclinic structure. The resistance of the film increased by 350% under tensile strain and by 5% under compressive strain. Maximal value of the gauge factor was found to be G≃103.
  • Keywords
    X-ray diffraction; copper compounds; electric resistance; liquid phase deposited coatings; semiconductor materials; semiconductor thin films; 293 to 298 K; CU7S4 films; Cu7S4; CuS thin flims; X-ray diffraction; complex-salt compounds; compressive strain; crystalline monoclinic structure; electric resistance; electrical properties; flexible substrates; gauge factor; polyimide substrate; room temperature; structural properties; tensile strain;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20040192
  • Filename
    1269503
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=906599