DocumentCode
906738
Title
The implementation of total quality management (TQM) in a semiconductor manufacturing operation
Author
Naguib, Hussein
Author_Institution
Xerox Microelectron. Center, El Segundo, CA, USA
Volume
6
Issue
2
fYear
1993
fDate
5/1/1993 12:00:00 AM
Firstpage
156
Lastpage
162
Abstract
The author reviews his five year experience in the implementation of total quality management (TQM) in the operation of the silicon wafer fabrication (fab) facility in Xerox Microelectronics Center (MEC). First, the TQM basic concepts and its operational implications are summarized. This is followed by a detailed description of the TQM implementation process in the wafer fab. Driven by Xerox corporate commitment to quality, the implementation process includes an organizational system analysis of MEC operations, a restructuring of the wafer fab organization, the formation of a quality council, the launching of a comprehensive education and training program, and the implementation of statistical process control techniques. Also, a cornerstone in the TQM strategy is empowering all employees through participation in problem solving and quality improvement teams, and involvement in an employee suggestion system. It is shown that the TQM strategy proved to be instrumental in achieving significant improvements in customer satisfaction, employee satisfaction, productivity, profitability, product quality, manufacturing costs, and on-time delivery
Keywords
integrated circuit manufacture; management; personnel; quality control; semiconductor device manufacture; statistical process control; SPC techniques; Si wafer fabrication facility; TQM strategy; Xerox Microelectronics Center; education; employee suggestion system; organizational system analysis; quality council; quality improvement teams; semiconductor manufacturing operation; statistical process control; total quality management; training program; Councils; Customer satisfaction; Educational programs; Fabrication; Instruments; Microelectronics; Problem-solving; Process control; Silicon; Total quality management;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/66.216934
Filename
216934
Link To Document