Title :
Current fluctuations caused by frequency variations in Gunn diodes
Author_Institution :
University of Sheffield, Department of Electronic & Electrical Engineering, Sheffield, UK
Abstract :
Measurements have been made of the current modulation of a Gunn diode by external frequency modulation. The current modulation varied between 10¿6 and 10¿3 A/MHz for various cavity conditions. This is smaller than the current noise observed by Faulkner and Meade. It is concluded that the current noise observed in their experiments was not caused simply by the frequency fluctuation.
Keywords :
Gunn oscillators; noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19700081
