Title :
Experimental 1 Mbit DRAM using power reduction techniques
Author :
Kimura, Katsutaka ; Itoh, Kiyoo ; Hori, Ryoichi ; Etoh, Jun ; Kawajiri, Yoshiki
Author_Institution :
Hitachi Ltd., Central Research Laboratory, Tokyo, Japan
fDate :
2/1/1985 12:00:00 AM
Abstract :
One of the serious problems which must be overcome in realising a 1 Mbit DRAM is high-power dissipation associated with data-line charging and discharging. To solve this problem, this paper proposes the following three techniques, which permit power reduction by about one-quarter: a multidivided data-line structure, 512 refresh cycles and an on-chip voltage limiter circuit. These techniques are proven to be useful through the design and evaluation of an experimental n-MOS 1 Mbit DRAM with a 46 mm2 chip size. The chip fabricated provides a 295 mW operating power at a 260 ns cycle time despite the fast access time of 90 ns. The possibility of further power reduction is also described.
Keywords :
field effect integrated circuits; integrated memory circuits; random-access storage; 1 Mbit DRAM; NMOS technology; access time 90 ns; cycle time 260 ns; data-line charging; multidivided data-line structure; onchip voltage limiter circuit; operating power 295 mW; power dissipation; power reduction techniques; refresh cycles;
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
DOI :
10.1049/ip-i-1.1985.0006