Title :
Excess Surface Resistance Due to Surface Roughness at 35 GHz
Author :
Tischer, Frederick J.
fDate :
5/1/1974 12:00:00 AM
Abstract :
The increase of the surface resistance of plane copper surfaces caused by mechanically generated surface roughness has been determined at 35 GHz by measuring and evaluating the Q values of an H-guide cavity with removable sidewalls. The sidewalls were ground one-directionally by using abrasive papers of various grades to produce various degrees of roughness. The rms values of roughess were measured mechanically and optically after calibration by microphotography.
Keywords :
Design methodology; Electrical resistance measurement; Filters; Frequency; Millimeter wave communication; Mirrors; Optical surface waves; Rough surfaces; Surface resistance; Surface roughness;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1974.1128285
