• DocumentCode
    907364
  • Title

    Thin film dielectric materials for microelectronics

  • Author

    Zaininger, Karl H. ; Wang, Chih-Chun

  • Author_Institution
    RCA Laboratories, Princeton, NJ
  • Volume
    57
  • Issue
    9
  • fYear
    1969
  • Firstpage
    1564
  • Lastpage
    1570
  • Abstract
    Important applications of dielectric films used in modern integrated circuit technology include dielectric insulation, surface passivation, diffusion masking, radiation resistance, and hermetic seal. These many functional applications pose stringent requirements on the various properties of the insulating films and the methods used for their preparation. To date silicon dioxide (SiO2) has been used almost exclusively because of 1) its ease of preparation, 2) its well-understood properties, and 3) its generally good compatibility and satisfactory interface with silicon. There are, however, drawbacks to the use of SiO2and other materials have been sought for better performance, greater versatility, higher reliability, and lower cost. These include binary metal oxides and silicon nitride. The state of the art of thin film dielectric materials for microelectronics is reviewed in this paper. The role of thin film dielectrics for devices is presented, and new and known materials are discussed for potential applications.
  • Keywords
    Dielectric films; Dielectric materials; Dielectric thin films; Dielectrics and electrical insulation; Integrated circuit technology; Microelectronics; Passivation; Silicon; Surface resistance; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1969.7337
  • Filename
    1449267