A new algorithm for experimental circuit modeling of interconnection structures based on causality

Author

Sercu, Stefaan ; Martens, Luc

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Belgium

Volume

19

Issue

2

fYear

1996

fDate

5/1/1996 12:00:00 AM

Firstpage

289

Lastpage

295

Abstract

A new algorithm is described for the circuit modeling of two-port interconnection structures starting from S-parameter measurements or simulations. The presented procedure is particularly useful in modeling interconnections with multiple discontinuities. The theory behind the method is based on the principle of causality. Step by step, a circuit model is proposed for each discontinuity and the corresponding parameter values are determined using the time-domain reflection and transmission response derived from the S-parameters. In this way, it is possible to obtain a circuit model for which each element is related to a certain physical part of the passive structure under test. The results show good-agreement between measured and modeled reflection and transmission waveforms

Keywords

integrated circuit interconnections; packaging; time-domain reflectometry; two-port networks; S-parameter measurements; causality; circuit modeling; multiple discontinuities; parameter values; passive structure; time-domain reflection response; time-domain transmission response; two-port interconnection structures; Circuit simulation; Circuit testing; Components, packaging, and manufacturing technology; Electronics packaging; Integrated circuit interconnections; Inverse problems; Reflection; Scattering parameters; Time domain analysis; Transmission line discontinuities;

fLanguage

English

Journal_Title

Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on

Publisher

ieee

ISSN

1070-9894

Type

jour

DOI

10.1109/96.496031

Filename

496031