Title :
Broadband characterization of low dielectric constant and low dielectric loss CYTUF cyanate ester printed circuit board material
Author :
Deutsch, Alina ; Surovic, Christopher W. ; Lanzetta, Alphonso P. ; Ainspan, Herschel A. ; Abbiate, Jean-Claude ; Viehbeck, Alfred ; Hedrick, Jeffrey C. ; Shaw, Jane M. ; Tisdale, Stephen L. ; Foster, Elizabeth F. ; Coteus, Paul W.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
5/1/1996 12:00:00 AM
Abstract :
Dielectric constant εr and broadband dielectric loss tan δ measurements were performed for the thermoplastic toughened cyanate ester printed circuit board CYTUF material. Characterization of tan δ over the 1-8 GHz frequency range was made using a simple short-pulse propagation technique. All the measurements were taken on four-metal-layer, 23×36 cm cards with representative transmission line structures. It was found the εr=3.48-3.64 and tan δ=0.0095-0.01, which are much lower than for standard FR-4 material. The impact of improved characteristics on wireability is analyzed through simulations of representative printed circuit board interconnections
Keywords :
dielectric losses; dielectric materials; permittivity; polymers; printed circuit manufacture; 1 to 8 GHz; CYTUF; broadband dielectric loss; dielectric constant; four-metal-layer cards; interconnections; printed circuit board material; short-pulse propagation; simulation; thermoplastic toughened cyanate ester; transmission line structures; wireability; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency; Loss measurement; Performance evaluation; Printed circuits; Transmission line measurements;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
