Title :
A Microprocessor Tester for the Treat Upgrade Reactor Trip System
Author :
Lenkszus, F.R. ; Bucher, R.G.
Author_Institution :
Argonne National Laboratory Argonne, Illinois 60439
Keywords :
Accidents; Assembly; Circuits; Inductors; Logic; Microprocessors; OFDM modulation; Production; Steady-state; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4336992
