DocumentCode

907586

Title

A Microprocessor Tester for the Treat Upgrade Reactor Trip System

Author

Lenkszus, F.R. ; Bucher, R.G.

Author_Institution

Argonne National Laboratory Argonne, Illinois 60439

Volume

32

Issue

1

fYear

1985

Firstpage

1030

Lastpage

1035

Keywords

Accidents; Assembly; Circuits; Inductors; Logic; Microprocessors; OFDM modulation; Production; Steady-state; System testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1985.4336992

Filename

4336992