• DocumentCode
    907608
  • Title

    High-current beta falloff

  • Author

    Clark, L.E.

  • Volume
    57
  • Issue
    9
  • fYear
    1969
  • Firstpage
    1670
  • Lastpage
    1671
  • Abstract
    High-level conditions at the emitter-base junction and current crowding have both been invoked to explain gain falloff at high collector currents in bipolar transistors. Results indicating that high-level conditions in lightly doped collector regions may also lead to current gain reduction at high-current densities are presented; a dependence of gain on Ic-1has been found experimentally.
  • Keywords
    Bipolar transistors; Charge carrier processes; Conductivity; Current density; Doping profiles; Geometry; Manufacturing; Proximity effect; Spontaneous emission; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1969.7361
  • Filename
    1449291