DocumentCode
907608
Title
High-current beta falloff
Author
Clark, L.E.
Volume
57
Issue
9
fYear
1969
Firstpage
1670
Lastpage
1671
Abstract
High-level conditions at the emitter-base junction and current crowding have both been invoked to explain gain falloff at high collector currents in bipolar transistors. Results indicating that high-level conditions in lightly doped collector regions may also lead to current gain reduction at high-current densities are presented; a dependence of gain on Ic -1has been found experimentally.
Keywords
Bipolar transistors; Charge carrier processes; Conductivity; Current density; Doping profiles; Geometry; Manufacturing; Proximity effect; Spontaneous emission; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1969.7361
Filename
1449291
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