Title :
Noise computation in single chip packages
Author :
Bathey, Kumaresh ; Swaminathan, Madhavan ; Smith, L.D. ; Cockerill, T.J.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
5/1/1996 12:00:00 AM
Abstract :
This paper describes the computation of noise in single chip packages forming an integral part of a larger system. An analysis tool is discussed that integrates the details of chip, first level, and second level packages to form a network for simulation. The tool is useful in the computation of noise generated by single chip packages and allows for post-layout, pre-fabrication noise estimation. This paper provides details on the components of noise including resonance which is often over looked in most computations. Time domain measurements have been used to validate the noise analysis
Keywords :
integrated circuit noise; integrated circuit packaging; first level packages; noise analysis; resonance; second level packages; simulation network; single chip packages; system analysis tool; time domain measurements; Circuit noise; Noise generators; Noise level; Noise measurement; Packaging; Resonance; Semiconductor device measurement; Time measurement; Voltage fluctuations; Working environment noise;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on