Title :
Characterization of Microwave Oscillator and Amplifier Circuits Using an IMPATT Diode Biased Below Breakdown (Short Papers)
Author :
Tozer, R.C. ; Charlton, R. ; Hobson, G.S.
fDate :
8/1/1974 12:00:00 AM
Abstract :
A convenient laboratory technique is described to measure the internal circuit loss, the load conductance, and equivalent circuit susceptances of microwave diode oscillators and amplifiers using an IMPATT diode biased just below its breakdown voltage.
Keywords :
Diodes; Electric breakdown; Equivalent circuits; Laboratories; Loss measurement; Microwave amplifiers; Microwave circuits; Microwave measurements; Microwave oscillators; Microwave theory and techniques;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1974.1128343
