DocumentCode :
907911
Title :
Temperature measurements of thin films on substrates
Author :
de Cogan, D. ; Howe, A.F. ; Webb, P.W.
Author_Institution :
University of Nottingham, Department of Electrical & Electronic Engineering, Nottingham, UK
Volume :
132
Issue :
3
fYear :
1985
fDate :
6/1/1985 12:00:00 AM
Firstpage :
143
Lastpage :
146
Abstract :
Thin-film fuses consisting of single layers of silver have been deposited on silica and alumina substrates. Results of temperature measurements are presented for the case where the fuse current is significantly below the level necessary for metal vaporisation and arc formation.
Keywords :
electric fuses; metallic thin films; silver; temperature distribution; Ag thin film; Al2O3; SiO2 substrate; alumina substrates; arc formation; fuse current; metal vaporisation; metallic thin film fuses; temperature distribution; temperature measurements;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1985.0029
Filename :
4643908
Link To Document :
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