Title :
Minimization of MOSFET gate leakage current in buffer amplifier circuits
Author :
Barker, R.W.J. ; Hart, B.L.
Author_Institution :
West Ham College of Technology, London, England
Abstract :
It is shown that the components of gate leakage current of a MOSFET used in a previously described unity gain buffer amplifier may be reduced to a minimum under static and dynamic conditions. Modified packaging and novel biasing techniques can minimize both extrinsic and intrinsic components of gate leakage current at the input to the amplifier.
Keywords :
Assembly; Broadband amplifiers; Electrodes; Impedance; Insulation; Leakage current; MOSFET circuits; Minimization; Packaging; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1969.7394
