Title :
Radiation Damage in Microcircuits Session Summary
Author_Institution :
Cornell University
Keywords :
CMOS technology; Circuits; Event detection; Ionizing radiation; Neutrons; Particle tracking; Physics; Radiation detectors; Space technology; Very large scale integration;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4337043
