• DocumentCode
    908382
  • Title

    Recent datareviews from EMIS. Diffusion coefficient of oxygen in silicon, temperature dependence

  • Volume
    132
  • Issue
    4
  • fYear
    1985
  • fDate
    8/1/1985 12:00:00 AM
  • Firstpage
    196
  • Lastpage
    197
  • Keywords
    diffusion in solids; elemental semiconductors; silicon; O diffusion; O diffusivity; Si; absolute temperature; diffusion coefficient; semiconductor; temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1985.0044
  • Filename
    4643956