Title :
Self-Biased Silicon Detectors with a Built-In Field for Measuring Heavy Charged Particles
Author :
Kim, Y. ; Kim, C. ; Ohkawa, S. ; Husimi, K. ; Shiraishi, Fumihide ; Osada, S. ; Abe, T. ; Sakai, T.
Author_Institution :
Dept. of Electronics Engr., Korea Univerity, Kodaira, Tokyo 187, Japan
Keywords :
Current measurement; Detectors; Epitaxial layers; Fabrication; Impurities; Particle measurements; Plasma measurements; Pulse measurements; Silicon; Substrates;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4337110
