DocumentCode
908883
Title
Thickness dependence of the electrical conductivity in vacuum deposited copper films
Author
Reale, C.
Volume
57
Issue
11
fYear
1969
Firstpage
2073
Lastpage
2075
Abstract
The size dependence of the conductivity observed in vacuum condensed copper films 200-1500 Å thick was interpreted by applying the Sondheimer theory on the assumption that the scattering of the carriers by the film boundaries is partially elastic. The fraction of electrons specularly reflected at the surfaces was determined by a method based on the anomalous skin effect.
Keywords
Conductive films; Conductivity; Copper; Current measurement; Diodes; Electrons; Luminescence; P-n junctions; Radiative recombination; Voltage measurement;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1969.7470
Filename
1449400
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