Title :
Automatic Load Contour Mapping for Microwave Power Transistors
Author :
Cusack, Joseph M. ; Perlow, Stewart M. ; Perlman, Barry S.
fDate :
12/1/1974 12:00:00 AM
Abstract :
A technique for large signal characterization of microwave power transistors is described. A computer-controlled apparatus is used to map contours of constant power and efficiency on a Smith chart for dynamic matching of both input and output circuits.
Keywords :
Circuit optimization; Frequency; Impedance matching; Impedance measurement; Microwave devices; Power generation; Power transistors; Pulse amplifiers; Scattering parameters; Signal design;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1974.1128456
