DocumentCode
909008
Title
On the potential function method and the increment error correction rule in pattern classification
Author
Babu, C.C. ; Wah-Chun Chan
Volume
57
Issue
11
fYear
1969
Firstpage
2086
Lastpage
2088
Abstract
Based on the basic property that the solution weight vector of the linear pattern classifier can be expressed as a linear function of the training patterns, it is shown that the increment error correction algorithm is a special case of the potential function method. For linearly separable training patterns, a form of potential function which appears to be useful is also proposed.
Keywords
Cutoff frequency; Epitaxial layers; Error correction; Geometry; Pattern classification; Scattering parameters; Sputter etching; Substrates; Testing; Transconductance;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1969.7482
Filename
1449412
Link To Document