Reliability Testing of Microwave Transistors for Array-Radar Applications

Solid-state array radar is of gyeat current interest because of the inherent reliability of solid-state devices and the concomitant promise for improvement in system reliability. However, no extensive reliability base has been established for solid-state devices employed under radar operating requirements. In this paper some of the important factors bearing a device reliability are treated. Accelerated life tests under RF conditions are presented for L-band power transistors. Preliminary life-test and failure-analysis data are also presented with recommendations on how the information can be used by the radar systems designer.