• DocumentCode
    909072
  • Title

    Dual MOS gate controlled thyristor (DMGCT) structure with short-circuit withstand capability superior to IGBT

  • Author

    Ajit, J.S.

  • Author_Institution
    Power Integrations Inc., Sunnyvale, CA, USA
  • Volume
    17
  • Issue
    6
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    294
  • Lastpage
    296
  • Abstract
    A dual MOS gate controlled thyristor (DMGCT) structure is analyzed with experimental data and shown to have superior performance over insulated-gate bipolar transistor (IGBT) for power switching applications. The DMGCT device structure consists of a thyristor structure with the thyristor current constrained to flow via the channel region of a MOSFET. Although this increases the on-state voltage drop in the thyristor current path by a small amount due to the voltage drop across the low-voltage series MOSFET, this structure allows control of the thyristor current by the gate voltage applied to the MOSFET even after latch-up of the thyristor. This configuration allows uniform turn-off in the device with no current crowding. The DMGCT does not have any parasitic thyristor structure. In contrast to the IGBT, the saturation current of the DMGCT can be controlled independently of the on-state voltage drop.
  • Keywords
    MOS-controlled thyristors; power semiconductor switches; dual MOS gate controlled thyristor; gate voltage; onstate voltage drop; power switching applications; saturation current control; series MOSFET; short-circuit withstand capability; Data analysis; Insulated gate bipolar transistors; Insulation; Low voltage; MOSFET circuits; Performance analysis; Proximity effect; Threshold voltage; Thyristors; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.496462
  • Filename
    496462