DocumentCode
909660
Title
Quantitative Analysis of Alpha Activities in Thick Sources Using Si Detectors
Author
Takami, Y. ; Hashimoto, T. ; Shiraishi, F. ; Voss, Keith
Author_Institution
Institute for Atomic Energy, Rikkyo University, Nagasaka, Yokosuka, 240-01, Japan
Volume
33
Issue
1
fYear
1986
Firstpage
639
Lastpage
642
Abstract
An alpha spectroscopy method for thick sources was developed. Alpha energy spectrum measured at a plane surface of a thick source is inversely proportional to the dE/dx of the medium. This principle was applied to analyze alpha nuclides in low level environmental samples quantitatively, using a large area Si Surface Barrier Detector(SBD).
Keywords
Alpha particles; Detectors; Electrodes; Energy measurement; Monitoring; Pollution measurement; Powders; Soil measurements; Spectroscopy; Surface contamination;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1986.4337183
Filename
4337183
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