• DocumentCode
    909726
  • Title

    Method of measuring mobility of majority carriers in silicon devices

  • Author

    Pals, J.A.

  • Author_Institution
    Philips Research Laboratories, NV Philips´ Gloeilampenfabrieken, Eindhoven, Netherlands
  • Volume
    6
  • Issue
    16
  • fYear
    1970
  • Firstpage
    503
  • Lastpage
    504
  • Abstract
    A method is described for measuring the mobility of majority carriers in a silicon layer bounded by a depletion region. Only standard measurements of capacitance and conductance have to be done. No other quantities, such as the concentration of the carriers, need be known.
  • Keywords
    electron mobility; semiconductor device testing;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19700350
  • Filename
    4234849
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=909726