DocumentCode :
910485
Title :
InGaAs-cap-monitor integrated 1.55 μm λ/4-shifted DFB lasers with higher output design
Author :
Usami, Masashi ; Akiba, Shigeyuki ; Utaka, Katsuyuki ; Matsushima, Yuichi
Author_Institution :
KDD Res. & Dev. Lab., Tokyo, Japan
Volume :
135
Issue :
4
fYear :
1988
fDate :
8/1/1988 12:00:00 AM
Firstpage :
289
Lastpage :
297
Abstract :
An InGaAs-cap-monitor photodiode is monolithically integrated with a 1.55 μm InGaAsP/InP λ/4-shifted DFB laser that has a higher output design. The optical coupling between the laser and the monitor is calculated using a Gaussian beam approximation, which shows that 20-40% of the rear light output can be monitored. The actual ratio of monitor current to front output at a temperature of 10-40°C is typically 0.1-0.2 mA/mW. It is shown that the integrated cap-monitor can be used, not only for the control of the laser power, but also for probing the threshold current and the single-wavelength property of an individual laser in a wafer, without cleaving out into chips. For the laser part with an antireflecting coating on the front facet, the maximum output power of 30 mW at 25°C and the highest CW temperature (as high as 100°C in p-side-up bonding) were obtained
Keywords :
III-V semiconductors; distributed feedback lasers; gallium arsenide; gallium compounds; indium compounds; integrated optics; integrated optoelectronics; laser transitions; optical couplers; photodiodes; semiconductor junction lasers; 1.55 micron; 30 mW; Gaussian beam approximation; III-V semiconductors; InGaAs-InP; InGaAs-cap-monitor integrated 1.55 μm DFB lasers; antireflecting coating; higher output design; integrated cap-monitor; monitor current to front output ratio; optical coupling; rear light output; single-wavelength property; threshold current;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings J
Publisher :
iet
ISSN :
0267-3932
Type :
jour
Filename :
21806
Link To Document :
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