A charge-based capacitance model of short-channel MOSFETs

Author

Chung, Steve Shao-Shiun

Author_Institution

Dept. of Electron. Eng. & Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan

Volume

8

Issue

1

fYear

1989

fDate

1/1/1989 12:00:00 AM

Firstpage

1

Lastpage

7

Abstract

A quasi-static two-dimensional intrinsic capacitance model for short-channel MOSFETs is discussed. It is derived based in a physically based charge-sharing scheme and implemented using a quasi-static solution of a MOS device simulator. Two-dimensional field-induced mobility degradation, velocity saturation, and short-channel effects are included in the model. The charge conservation rule holds, and channel charge partitioning is properly treated. The simulation results clearly show the importance of two-dimensional field-induced effects to short-channel MOS devices. Comparison of the simulated results with experimentally measured data shows that the model is far more reliable than the analytical one. The method can be used to link a device simulator and a circuit simulator for accurate timing calculation in both digital and analog MOS integrated circuits

Keywords

MOS integrated circuits; capacitance; circuit analysis computing; equivalent circuits; insulated gate field effect transistors; semiconductor device models; 2D intrinsic capacitance model; MOS device simulator; analogue ICs; channel charge partitioning; charge conservation rule; charge-based capacitance model; charge-sharing scheme; device/circuit simulators linking; digital ICs; field-induced mobility degradation; quasi-static solution; short-channel MOSFETs; short-channel effects; timing calculation; two-dimensional field-induced effects; velocity saturation; Analytical models; Capacitance; Circuit simulation; Degradation; Integrated circuit measurements; Integrated circuit reliability; MOS devices; MOS integrated circuits; MOSFETs; Timing;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.21813

Filename

21813