Title :
Effects of Heavy Ions on Microcircuits in Space: Recently Investigated Upset Mechanisms
Author :
Koga, R. ; Kolasinski, W.A.
Author_Institution :
Space Sciences Laboratory, The Aerospace Corporation P. O. Box 92957, Los Angeles, CA 90009
Abstract :
Upsets of microcircuits in space have been attributed to heavy ions. In recent studies of the failure mechanisms, we have employed a wide range of test methods. These studies and the application of the test results to space borne microcircuits are presented.
Keywords :
Aerospace testing; Cosmic rays; Extraterrestrial measurements; Motor drives; Particle beam measurements; Position sensitive particle detectors; Semiconductor device measurement; Single event upset; Solid scintillation detectors; Temperature distribution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337299
