Title :
Design of Self-Diagnosis System for Nuclear Instrumentation
Author :
Nagai, Shinichiro ; Takeuchi, Satoshi ; Yamashita, Mikio
Author_Institution :
Department of Electronic Engineering, Saitama University, Shimo-Ohkubo, Urawa, Saitama, Japan
Abstract :
The use of non-randomness measurements for self-diagnosis of a pulse-counting system is described. Characteristic patterns of interval distributions for nuclear pulse trains have been measured under various types of malfunctions. They can be fundamental data in designing a stochastic indicator for malfunctions. Discussions on possible applications of interval distributions are made. An example of diagnosis system is shown which indicates the presence of malfunction by data processing of time interval distributions.
Keywords :
Circuit noise; Circuit simulation; Data processing; Frequency conversion; Instruments; Noise generators; Noise level; Nuclear measurements; Pulse measurements; Time measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337313