• DocumentCode
    911024
  • Title

    A pipelined temporal difference imager

  • Author

    Gruev, Viktor ; Etienne-Cummings, Ralph

  • Author_Institution
    Electr. & Comput. Eng. Dept., Johns Hopkins Univ., Baltimore, MD, USA
  • Volume
    39
  • Issue
    3
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    538
  • Lastpage
    543
  • Abstract
    A 189×182 active pixel sensor (APS) for temporal difference computation is presented. The temporal difference imager (TDI), fabricated in 0.5-μm CMOS process, contains in-pixel storage elements for a previous image frame. Difference double-sampling circuits are used to suppress the fixed pattern noise in both images and to compute the difference between the corrected images. The pixel area occupies 25 μm by 25 μm (using 0.7-μm scalable rules), with fill factor of 30%. A novel pipelined readout technique is described, which is used to improve the accuracy of the temporal difference computation. With this pipelined readout architecture, >8-bit precision for the difference image and low spatial droop across the difference image is achieved. The chip consumes 30 mW at 50 fps from a 5-V power supply.
  • Keywords
    CMOS image sensors; sampled data circuits; 182 pixel; 189 pixel; 25 micron; 30 mW; 5 V; CMOS process; active pixel sensor; difference double-sampling circuits; fill factor; fixed pattern noise; image frame; in-pixel storage elements; pipelined readout architecture; pipelined readout technique; pipelined temporal difference imager; power consumption; power supply; spatial droop; temporal difference computation; Atmosphere; Atmospheric waves; Circuits; Computer architecture; Delay effects; Image storage; Layout; Leakage current; Phase distortion; Video compression;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2003.822777
  • Filename
    1269933