DocumentCode :
911110
Title :
Quasilinear formulation with a simple remeshing scheme for the finite element based simulation of dopant diffusion in silicon
Author :
Amaratunga, G.A.J. ; Ismail, R.
Author_Institution :
University of Southampton, Department of Electronics and Information Engineering, Southampton, UK
Volume :
133
Issue :
6
fYear :
1986
fDate :
12/1/1986 12:00:00 AM
Firstpage :
221
Lastpage :
228
Abstract :
The weighted residual formulation of the finite-element method is used to solve the nonlinear diffusion equation which describes dopant diffusion. Discretisation in the time domain is carried out using the Crank-Nicolson implicit scheme. A remeshing scheme based on a continuity criterion obtained by comparing the concentration values of adjacent nodes is used to introduce or eliminate nodes in the spatial domain as the diffusion proceeds in time. This scheme which uses an average diffusivity across each element has been successfully applied to the simulation of As diffusion in Si, and overcomes the oscillation and instability which would otherwise occur if a uniform mesh with the same number of nodes were used.
Keywords :
arsenic; diffusion in solids; doping profiles; elemental semiconductors; finite element analysis; silicon; Crank-Nicolson implicit scheme; Si:As; continuity criterion; dopant diffusion; finite element based simulation; nonlinear diffusion equation; quasilinear formulation; remeshing scheme; semiconductor; time domain discretisation; weighted residual formulation;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
Publisher :
iet
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1986.0046
Filename :
4644234
Link To Document :
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