Title :
Mismatch simulation for layout sensitive parameters of IC components and devices
Author :
Tröster, Gerhard ; Tomaszewski, Peter
Author_Institution :
Telefunken Electron. GmbH, Heilbronn, West Germany
fDate :
2/1/1989 12:00:00 AM
Abstract :
A compact Monte-Carlo-based universal procedure is presented that allows the estimation and qualification of geometrical arrangements and matching strategies, especially in monolithic devices. On the basis of a simple circuit example, the general structure of the main algorithm is explained, and some extensions are discussed. Experimental results on different configurations illustrate the broad application range
Keywords :
Monte Carlo methods; circuit layout; IC components; Monte-Carlo-based universal procedure; application range; geometrical arrangements; layout sensitive parameters; matching strategies; Capacitors; Circuit faults; Circuit stability; Helium; Integrated circuit layout; Monolithic integrated circuits; Monte Carlo methods; Qualifications; Solid modeling; Threshold voltage;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
