DocumentCode
911135
Title
Mismatch simulation for layout sensitive parameters of IC components and devices
Author
Tröster, Gerhard ; Tomaszewski, Peter
Author_Institution
Telefunken Electron. GmbH, Heilbronn, West Germany
Volume
8
Issue
2
fYear
1989
fDate
2/1/1989 12:00:00 AM
Firstpage
101
Lastpage
107
Abstract
A compact Monte-Carlo-based universal procedure is presented that allows the estimation and qualification of geometrical arrangements and matching strategies, especially in monolithic devices. On the basis of a simple circuit example, the general structure of the main algorithm is explained, and some extensions are discussed. Experimental results on different configurations illustrate the broad application range
Keywords
Monte Carlo methods; circuit layout; IC components; Monte-Carlo-based universal procedure; application range; geometrical arrangements; layout sensitive parameters; matching strategies; Capacitors; Circuit faults; Circuit stability; Helium; Integrated circuit layout; Monolithic integrated circuits; Monte Carlo methods; Qualifications; Solid modeling; Threshold voltage;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.21828
Filename
21828
Link To Document