• DocumentCode
    911515
  • Title

    Diodes as pseudo-active elements in high-frequency DC/DC converters

  • Author

    Divan, Deepakraj M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    4
  • Issue
    1
  • fYear
    1989
  • fDate
    1/1/1989 12:00:00 AM
  • Firstpage
    8
  • Lastpage
    14
  • Abstract
    A novel approach to realizing zero-voltage switching in high-frequency DC/DC converters is presented. Utilizing the parasitic associated with the diode stored charge, it is shown that the diode reverse current established for charge removal can be used advantageously to accomplish soft switching. The entire family of single-transistor DC/DC converters can be realized using the technique. The converter topologies are seen to differ from their hard-switched counterparts only by the presence of a resonant capacitor. It is also shown that device and component stresses are moderate as compared to existing quasi-resonant and resonant techniques. Converter analysis is rather complex as a result of the dominant diode nonlinearities, and no closed-form expressions are possible. Converter transfer characteristics are obtained through simulation, and operating limits are analytically obtained. The concept is validated by experimental results using buck-type converters rated at approximately 100 W and operating at frequencies around 1 MHz
  • Keywords
    power convertors; semiconductor diodes; switching circuits; 1 MHz; 100 W; buck-type converters; diode reverse current; diode stored charge; dominant diode nonlinearities; high-frequency DC/DC converters; operating limits; parasitic; pseudo-active elements; resonant capacitor; soft switching; transfer characteristics; zero-voltage switching; Analytical models; Capacitors; Closed-form solution; DC-DC power converters; Diodes; Frequency conversion; Resonance; Stress; Topology; Zero voltage switching;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/63.21868
  • Filename
    21868