Title :
The1975 S-MTT National Lectureship, Dec. 1975
Author :
Beatty, Robert W.
fDate :
12/1/1975 12:00:00 AM
Abstract :
The development of modern computer-controlled measurement systems has given the microwave engineer a fantastic tool for the design and testing of components and systems. Going beyond the point of fast, automatic measurements, they now give promise of high accuracy and are revolutionizing the microwave measurement field.
Keywords :
Computer displays; Helium; IEC standards; Instruments; Laboratories; Microwave measurements; NIST; Pulse measurements; Radar; Software measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1975.1128726
