• DocumentCode
    911991
  • Title

    Temperature dependence of threshold current of In1-x GaxAsyP1-y lasers with different compositions

  • Author

    Haug, A. ; Burkhard, H.

  • Author_Institution
    Max-Planck-Institut f¿¿r Festk¿¿rperforschung, Stuttgart, West Germany
  • Volume
    134
  • Issue
    2
  • fYear
    1987
  • fDate
    4/1/1987 12:00:00 AM
  • Firstpage
    117
  • Lastpage
    121
  • Abstract
    Measurements of the temperature dependence of the threshold current of InGaAsP/InP lasers are presented for compositions with wavelengths ¿¿ = 1.55 and 1.65 ¿¿m. 1.55 ¿¿m lasers have been investigated with either three or four epitaxial layers to study the influence of leakage currents. The experimental results are compared with theoretical investigations which are based on the assumption that Auger recombination is responsible for the temperature behaviour. The calculation of the Auger processes is reinvestigated. Fair agreement between experiment and theory demonstrates that Auger processes are the main cause for the temperature sensitivity of InGaAsP lasers.
  • Keywords
    Auger effect; III-V semiconductors; gallium arsenide; indium compounds; semiconductor junction lasers; 1.55 micron; 1.65 micron; Auger recombination; InGaAsP-InP; composition dependence; epitaxial layers; leakage currents; temperature dependence; threshold current;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings J
  • Publisher
    iet
  • ISSN
    0267-3932
  • Type

    jour

  • DOI
    10.1049/ip-j.1987.0019
  • Filename
    4644336