DocumentCode
911991
Title
Temperature dependence of threshold current of In1-x GaxAsyP1-y lasers with different compositions
Author
Haug, A. ; Burkhard, H.
Author_Institution
Max-Planck-Institut f¿¿r Festk¿¿rperforschung, Stuttgart, West Germany
Volume
134
Issue
2
fYear
1987
fDate
4/1/1987 12:00:00 AM
Firstpage
117
Lastpage
121
Abstract
Measurements of the temperature dependence of the threshold current of InGaAsP/InP lasers are presented for compositions with wavelengths ¿¿ = 1.55 and 1.65 ¿¿m. 1.55 ¿¿m lasers have been investigated with either three or four epitaxial layers to study the influence of leakage currents. The experimental results are compared with theoretical investigations which are based on the assumption that Auger recombination is responsible for the temperature behaviour. The calculation of the Auger processes is reinvestigated. Fair agreement between experiment and theory demonstrates that Auger processes are the main cause for the temperature sensitivity of InGaAsP lasers.
Keywords
Auger effect; III-V semiconductors; gallium arsenide; indium compounds; semiconductor junction lasers; 1.55 micron; 1.65 micron; Auger recombination; InGaAsP-InP; composition dependence; epitaxial layers; leakage currents; temperature dependence; threshold current;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings J
Publisher
iet
ISSN
0267-3932
Type
jour
DOI
10.1049/ip-j.1987.0019
Filename
4644336
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