Title :
A Hierarchy-Driven Amalgamation of Standard and Macro Cells
Author :
Reingold, Edward M. ; Supowit, Kenneth J.
Author_Institution :
Department of Computer Science, University of Illinois, Urbana, IL, USA
fDate :
1/1/1984 12:00:00 AM
Abstract :
A new methodology for the automatic layout of integrated circuits is presented. The methodology, based on a hierarchical description of the circuit, is a hybrid between standard cell and fully custom, having the advantages of both. It has the ease of placement and routing of standard cell, combined with the ability to handle large numbers of diverse cells as in fully custom. The methodology has been implemented and applied to several circuits, with very encouraging results.
Keywords :
Area measurement; Computer science; Heuristic algorithms; Integrated circuit interconnections; Integrated circuit layout; Laboratories; Length measurement; Particle measurements; Power system interconnection; Semiconductor device measurement;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.1984.1270051