DocumentCode
912482
Title
Three-Dimensional Monte Carlo Simulations--Part I: Implanted Profiles for Dopants in Submicron Device
Author
Mazzone, A.M. ; Rocca, G.
Author_Institution
CNR Institute LAMEL, Bologna, Italy
Volume
3
Issue
1
fYear
1984
fDate
1/1/1984 12:00:00 AM
Firstpage
64
Lastpage
71
Abstract
Monte Carlo methods are used to simulate implants. The results fall into two different groups. On one side, size-dependent effects due to the presence of the mask are analyzed and discussed. On the other side, physical mechanisms dependent on dose and energy, like channeling and transition crystal-amorphous, are briefly reviewed.
Keywords
Amorphous materials; Circuit simulation; Computational modeling; Control theory; Distribution functions; Industrial electronics; Lattices; Mathematics; Monte Carlo methods; Semiconductor process modeling;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.1984.1270058
Filename
1270058
Link To Document